Simultaneous Monitoring of Bias, Linearity and Precision of Multiple Measurement Gauges

S304,Stanley Ho Building, UM

Event Information

Event NameSimultaneous Monitoring of Bias, Linearity and Precision of Multiple Measurement Gauges
OrganizerFaculty of Business Administration, UM
Date2006/03/08 - 2006/03/08
Time00:00:00 - 00:00:00
VenueS304,Stanley Ho Building, UM
Target AudienceAll are welcome

Contact Person for Details

NameDr. T. C. Chang
Tel.NoDr. T. C. Chang
Fax838320
Mail397-4721